Test and Measurement based on SiTime Solution
High-performance test equipment like oscilloscopes and spectrum analyzers requires precise, stable timing for accurate signal measurement. SiTime MEMS-based TCXOs and OCXOs deliver low phase noise, superior stability, and better aging performance than quartz, ensuring long-term accuracy and reliability even in harsh conditions. Ideal for advanced signal analysis across lab and field environments.
CATEGORY
Industrial,Programmable logic
CREATED DATE:
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PARTS IN DESIGN / BOM
| MFGR | PART# | BLK NM |
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