MICROFJ-30035-TSV-TR1

ON Semiconductor’s J-Series low-light sensors feature a high PDE (photon detection efficiency) that is achieved using a high-volume, P-on-N silicon foundry process. The J-Series sensors incorporate major improvements in the transit time spread which results in a significant improvement in the timing performance of the sensor. J-Series sensors are available in different sizes (3 mm, 4 mm and 6 mm) and use a TSV (Through Silicon Via) process to create a package with minimal deadspace, that is compatible with industry standard lead-free, reflow soldering processes.

• High-density microcells
• J-Series sensors feature ON Semiconductor's unique "fast output"" terminal
• Temperature stability of 21.5 mV/°C
• Exceptional breakdown voltage uniformity of ±250 mV
• Available in a reflow solder compatible TSV chip-scale package
• Ultra-low dark count rates of 50 kHz/mm2 typical
• Optimized for high-performance timing applications, such as ToF-PET
• Bias voltage of less than 30 V
• 3 mm, 4 mm and 6 mm sensor sizes