74LVC1G00GV-Q100H

The 74LVC1G00-Q100 provides the single 2-input NAND function. Input can be driven from either 3.3 V or 5 V devices. These features allow the use of these devices in a mixed 3.3 V and 5 V environment. Schmitt trigger action at all inputs makes the circuit tolerant for slower input rise and fall time. This device is fully specified for partial power-down applications using IOFF. The IOFF circuitry disables the output, preventing the damaging backflow current through the device when it is powered down. This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.

• Automotive product qualification in accordance with AEC-Q100 (Grade 1)
  • Specified from -40 °C to +85 °C and from -40 °C to +125 °C
• Wide supply voltage range from 1.65 V to 5.5 V
• High noise immunity
• Complies with JEDEC standard:
  • JESD8-7 (1.65 V to 1.95 V)
  • JESD8-5 (2.3 V to 2.7 V)
  • JESD8-B/JESD36 (2.7 V to 3.6 V)
• ±24 mA output drive (V_CC = 3.0 V)
• CMOS low power consumption
• Latch-up performance exceeds 250 mA
• Direct interface with TTL levels
• Inputs accept voltages up to 5 V
• Multiple package options
• ESD protection:
  • MIL-STD-883, method 3015 exceeds 2000 V
  • HBM JESD22-A114F exceeds 2000 V
  • MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 O)