MT40A4G8NEA-062E:F
DRAM, DDR4, 32 Gbit, 4G x 8bit, 1.6 GHz, FBGA, 78 Pins
MT40A4G8NEA-062E:F is a TwinDie™ 1.2V DDR4 SDRAM. This is a high-speed, CMOS dynamic random access memory device internally configured as two 16-bank DDR4 SDRAM devices. Although each die is tested individually within the dual-die package, some TwinDie test results may vary from a like-die tested within a monolithic die package. The DDR4 SDRAM uses a double data rate architecture to achieve high-speed operation. The double data rate architecture is an 8n-prefetch architecture with an interface designed to transfer two data words per clock cycle at the I/O balls. A single read or write access consists of a single 8n-bit-wide, one-clock-cycle data transfer at the internal DRAM core and eight corresponding n-bit-wide, one-half-clock-cycle data transfers at the I/O balls.
- 128Meg x 8 x 16 banks x 2 ranks
- Each rank has 4 groups of 4 internal banks for concurrent operation
- 3200MT/s data rate
- 0.625ns at CL = 22 (DDR4-3200) timing – cycle time
- VDD = VDDQ = 1.2V (1.14–1.26V)
- 1.2V VDDQ-terminated I/O
- 13.75ns tAA, 13.75ns tRCD and 13.75ns tRP
- 128K A[16:0] row address and 1K A[9:0] column address
- 78-ball FBGA package (7.5mm x 11mm x 1.2mm) Die Rev :F
- Operating temperature commercial range from (0°C = TC = 95°C)
Technical Attributes
Find Similar Parts
| Description | Value | |
|---|---|---|
| 1.6 GHz | ||
| DDR4 | ||
| FBGA | ||
| Surface Mount | ||
| 4G x 8bit | ||
| 78 | ||
| 95 °C | ||
| 0 °C | ||
| 1.2 V V |
ECCN / UNSPSC / COO
| Description | Value |
|---|---|
| Country of Origin: | null |
| ECCN: | EAR99 |
| HTSN: | null |
| Schedule B: | null |